This mini-tutorial provides an introduction to combinatorial interaction testing (CIT). The main idea behind CIT is to pseudo-exhaustively test software and hardware systems by covering combinations of components in order to detect faults. In 90 minutes, we provide an overview of this domain that includes the following topics: the role of CIT in software and hardware testing, how it complements and differs from design of experiments, considerations such as variable strength and constraints, the typical combinatorial arrays used for constructing test suites, and existing tools for test suite construction. Last, defense systems are increasingly relying on software with embedded machine learning (ML), yet ML poses unique challenges to applying conventional software testing due to characteristics such as the large input space, effort required for white box testing, and emergent behaviors apparent only at integration or system levels. As a well-studied black box approach to testing integrated systems with a pseudo-exhaustive strategy for handling large input spaces, CIT provides a good foundation for testing ML. In closing, we present recent research adapting concepts of combinatorial coverage to test design for ML.
- Күн бұрын
Combinatorial Interaction Testing
- Рет қаралды 705
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