If designing chips in cars sounds difficult, try designing them for space. There are huge temperature swings, and more radioactive particles than on Earth, which can cause single-event upsets, transients, functional interrupts, and latch-ups. A destructive latch-up can ruin a device, and in space that could transform an expensive piece of hardware into space junk. Ian Land, senior director for Synopsys aerospace and government vertical solutions, talks with Semiconductor Engineering about what’s needed to address these random events, what kinds of faults they can cause, and what’s needed to fix a problem after it occurs.
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