The Materials Characterization Lab: Technique XRD
The term X-ray Scattering encompasses many techniques used to characterize materials. X-ray diffraction (XRD) has traditionally been applied to well-ordered crystalline materials to determine crystal structures and identify phase composition. XRD techniques measure stress, preferred orientation, and crystallinity. The field also encompasses the characterization of non- or semi-crystalline materials via small-angle X-ray scattering (SAXS).
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Негізгі бет Introduction to X-ray Diffraction (XRD)
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