Bruker's XFlash® 7 - The EDS Detector for Scanning Electron Microscopy enables fast live chemical mapping using ESPRIT LiveMap with output count rates up to 1000 kcps. ESPRIT LiveMap can be used for a multitude of applications where ROI identification is necessary, e.g. to locate intermetallics, contamination, interface region, trace elements, etc.
Visit bruker.com/XFlash7 to discover more!
Негізгі бет Ғылым және технология Live chemical mapping of Sn-Cu solder region in Al-Si alloy with ESPRIT LiveMap
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