FormFactor's Autonomous DC Measurement Assistant enables true hands-free 24/7 wafer probing over temperature and on Autonomous DC Measurement Assistant - Contact Intelligence | FormFactorsmall pads down to 30 µm. It reduces cost of test and increases throughput by automatically aligning probes-to-pads and managing thermal transition and soak times - without any operator intervention. By dynamically controlling each probe touchdown Auto DC improves test data with optimized contact resistance. Auto DC enables remote operation from home or anywhere in the world.
- Autonomous 24/7 Operation: Up to 4x faster DC parametric thermal testing on 30 μm pads
- Small Pad Probing: Accurate contact of small pads down to 30 μm
- Optimized Contact Resistance: Improved test data with dynamic control of each probe touchdown
- Multi-DUT Layout Testing: Enhanced test flexibility and increased throughput
- Measurements Over Temperature: EMI-shielded, dark and frost-free
#AutonomousDCMeasurement #WaferProbing
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