This workshop will highlight the best methods for setting up, calibrating, and evaluating measurement performance in coaxial probes up to 145 GHz and in waveguide bands spanning WR15 (75 GHz) to WR1 (1100 GHz) over a broad (-40°C to 125°C) temperature range. We present a novel means by which directly-connected waveguide probes can still be used for reliable over-temperature testing on a semi-automated wafer prober and maintain ease of operation. Practical programming examples using WinCal XE software are demonstrated automating data measurement and analysis for on-wafer parametric measurements, and to evaluate system stability and performance.
#WinCalXE #SemiAutomatedWaferProber
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Негізгі бет Ғылым және технология Thermal On-Wafer S-Parameter Measurement Best Practices - FormFactor
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