In this example of the elemental mapping of a seaworm sample Image Extension was employed to capture the entire sample. The 4 x 3 frames were automatically stitched together using Bruker's ESPRIT software.
With a simple click, Image Extension automatically stitches together multiple frames, extending the measurement area and providing a panoramic view of the sample. This innovative feature unlocks new possibilities for comprehensive analysis and visualization in various fields of research.
This particular sample was imaged using the XFlash® FlatQUAD detector, whose unique design facilitates high-resolution elemental mapping at the low energy required by delicate biological samples.
The integration of Image Extension with the XFlash® FlatQUAD detector represents a significant advancement in imaging technology, offering high speed mappings and count rates even at low beam currents.
Негізгі бет Ғылым және технология Enhancing the Sample Measurement Area in SEM EDS with Image Extension
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