The ability to grow high quality compound semiconductor material on Silicon has allowed exploitations of mature logic and RFCMOS 300mm wafer processing technologies, making Silicon a particularly attractive solution for developing low-cost photonic integrated circuits with high levels of integrations and functions. Wafer-level photonic test is a critical capability for foundries to speed up the development of processing technologies and device models as well as to ensure performance and yield in production. This talk focuses on the challenges and solutions for wafer-level photonic tests which include fast, reproducible optical coupling with fiber-on-device position optimization to allow for accurate optical and electrical measurements.
#SiliconPhotonics #WaferTest
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Негізгі бет Ғылым және технология Silicon Photonics Wafer Level Test Measurement (Chinese) | FormFactor
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