Visualization of grain growth in a Gold thin film during in-situ heating in a SEM. Bright Field (BF)-like images can be acquired and saved automatically every few seconds using the new OPTIMUS-VUE screen combined with the new Time Resolved Measurements (TRM) feature in ESPRIT 2. The TRM feature can also be set to acquire, save and reapeat acquisition of TKD, EBSD and/or EDS maps for the entire duration of an in-situ experiment in the SEM or TEM. Images can be subsequently used to create a stack/video showing the evolution of microstructural feature during the in-situ experiment. Results are courtesy of Alice Da Silva Fanta from DTU Nanolab in Copenhagen, Denmark.
Негізгі бет Ғылым және технология Near real time visualization ARGUS EBSD
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